Switch-Level Test Generation of Competing Bridging Faults in the Presence of Feedback

This paper presents an efficient scheme to improve the test generation of voltage testing under the competing bridge fault model. A procedure is presented that extracts test generation objectives from switch-level networks, which will maximize the likelihood of detecting a bridging fault that is undetectable by a stuck-at test set. The effects of both active feedback and variations in transistor parameters are taken into account. The experimental results show that the proposed method generates a significant increase in fault coverage at a relatively low computational cost.